A Study of Molecular Compound Formation Between Dinitrogen Tetroxide And Some Sulfur-Containing Lewis Bases

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It is recognized that the absence of nitrogen dioxide radicals before mixing the dinitrogen tetroxlde-chloroform solutions and the sulfide-chloroform solutions does not absolutely preclude their lormaticoi acid subsequent reaction after mixing the solutions. However, such a svipposition lacks the slightest support from any of the previously studied addition compounds 55 of dinltrogen tetroxide and Lewis bases. Accordingly, the existence of nitrogen dioxide radicals in these addition compotmds m...ay be considered to be highly improbable.
The conclusion most consistent isith the facts is that the sulfide-dinitrogen tetroxide addition compounds which were studied contain molecular dinitrogen tetroxide. It is upon this basis that tto significance of the dielectric craistant sttdies will be evaluated.
Dielectric Constant Studies . Th© capacitance, C, of a con- denser is the ratio of the charge, Q, on one of its plates to the difference in potential, V, between its plates.
V The capacitance is a function of the physical dimensions of the particular condenser which is used as well as the nature cf the dielectric, or insulation, between the condenser plates.'' The ratio of the capacitance of a condenser viith some par- ticular substance as the dielectric, Cj^, to the capacitance of a condenser with no material dielectric, i.e., a vacuum between the plates, Cy^ is the dielectric constant, £ .


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