Sensitivity of Two Beam Transmission Electron Microscope Images to the Structure of Small Crystal Defects
Sensitivity of Two Beam Transmission Electron Microscope Images to the Structure of Small Crystal Defects
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In our eReader you can find the full English version of the book. Read Sensitivity of Two Beam Transmission Electron Microscope Images to the Structure of Small Crystal Defects Online - link to read the book on full screen. Our eReader also allows you to upload and read Pdf, Txt, ePub and fb2 books. In the Mini eReder on the page below you can quickly view all pages of the book - Read Book Sensitivity of Two Beam Transmission Electron Microscope Images to the Structure of Small Crystal Defects
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The most common TEM imaging mode (dynamical two beam imaging) produces indirect images of a defect and the relationship between a defect and its image was examined by the use of computer simulations. Small dislocation loop images were studied most extensively, but an investigation of radiation damage in aluminum alloys expanded consideration to the images of small platelike precipitates.
Conclusions A computer study of the transmission electron microscope images of small defects has dissected t...he theory into a few components which determine the main features of the image. The oscillations of the black-white vector of small loop images has been qualitatively described (Riihle et al . , 1965) but this study explains the above or below background nature of an image point induced by displaced atoms in terms of the wave interference responsible for diffraction. The shape of the image is shown to arise from the resolved displacements of the defect. A simple and 158 159 intuitively manageable graphical method (the polar displacement plot) is presented for predicting the image.
What to read after Sensitivity of Two Beam Transmission Electron Microscope Images to the Structure of Small Crystal Defects?
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To quickly assess the difficulty of the text, read a short excerpt:
The most common TEM imaging mode (dynamical two beam imaging) produces indirect images of a defect and the relationship between a defect and its image was examined by the use of computer simulations. Small dislocation loop images were studied most extensively, but an investigation of radiation damage in aluminum alloys expanded consideration to the images of small platelike precipitates.
Conclusions A computer study of the transmission electron microscope images of small defects has dissected t...he theory into a few components which determine the main features of the image. The oscillations of the black-white vector of small loop images has been qualitatively described (Riihle et al . , 1965) but this study explains the above or below background nature of an image point induced by displaced atoms in terms of the wave interference responsible for diffraction. The shape of the image is shown to arise from the resolved displacements of the defect. A simple and 158 159 intuitively manageable graphical method (the polar displacement plot) is presented for predicting the image.
What to read after Sensitivity of Two Beam Transmission Electron Microscope Images to the Structure of Small Crystal Defects?
You can find similar books in the "Read Also" column, or choose other free books by Sykes, Lawrence Joseph to read onlineMoreLess
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