Use of the Differential Reflectometer in the Study of Thin Film Corrosion Products On Copper
Use of the Differential Reflectometer in the Study of Thin Film Corrosion Products On Copper
Shanley, Charles William
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In this case, n Q = 1.33, the index of refraction of water, which is approximately that of the electrolyte. These calculations have been performed for the case of a cupric oxide (CuO) film since the optical constants for that compound have been published as a function of wavelength. The optical constants for copper which were used in these calculations are those of Schultz and 54 55 Tangherlini ' and are given in Table 4. Figure 17 is the plot of the variation in AR/R for CuO film on copper sub...strates as a function of film thickness for a fixed wavelength of light. The particular wavelength used in these calculations was 600 nm, but the curve is similar to those calculated for other wave- lengths. The curve shows a large increase in the dif- ferential reflectivity for the first few hundred angstroms of film thickness, followed by strong oscillations which are gradually damped out. The oscillations are caused by interference effects which occur when the film thickness is of the same order of magnitude as the wavelength of the incoming light.
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