Use of the Differential Reflectometer in the Study of Thin Film Corrosion Products On Copper
Use of the Differential Reflectometer in the Study of Thin Film Corrosion Products On Copper
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In our eReader you can find the full English version of the book. Read Use of the Differential Reflectometer in the Study of Thin Film Corrosion Products On Copper Online - link to read the book on full screen. Our eReader also allows you to upload and read Pdf, Txt, ePub and fb2 books. In the Mini eReder on the page below you can quickly view all pages of the book - Read Book Use of the Differential Reflectometer in the Study of Thin Film Corrosion Products On Copper
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In this case, n Q = 1.33, the index of refraction of water, which is approximately that of the electrolyte.
These calculations have been performed for the case of a cupric oxide (CuO) film since the optical constants for that compound have been published as a function of wavelength. The optical constants for copper which were used in these calculations are those of Schultz and 54 55 Tangherlini ' and are given in Table 4.
Figure 17 is the plot of the variation in AR/R for CuO film on copper sub...strates as a function of film thickness for a fixed wavelength of light. The particular wavelength used in these calculations was 600 nm, but the curve is similar to those calculated for other wave- lengths. The curve shows a large increase in the dif- ferential reflectivity for the first few hundred angstroms of film thickness, followed by strong oscillations which are gradually damped out. The oscillations are caused by interference effects which occur when the film thickness is of the same order of magnitude as the wavelength of the incoming light.
What to read after Use of the Differential Reflectometer in the Study of Thin Film Corrosion Products On Copper?
You can find similar books in the "Read Also" column, or choose other free books by Shanley, Charles William to read onlineMoreLess
To quickly assess the difficulty of the text, read a short excerpt:
In this case, n Q = 1.33, the index of refraction of water, which is approximately that of the electrolyte.
These calculations have been performed for the case of a cupric oxide (CuO) film since the optical constants for that compound have been published as a function of wavelength. The optical constants for copper which were used in these calculations are those of Schultz and 54 55 Tangherlini ' and are given in Table 4.
Figure 17 is the plot of the variation in AR/R for CuO film on copper sub...strates as a function of film thickness for a fixed wavelength of light. The particular wavelength used in these calculations was 600 nm, but the curve is similar to those calculated for other wave- lengths. The curve shows a large increase in the dif- ferential reflectivity for the first few hundred angstroms of film thickness, followed by strong oscillations which are gradually damped out. The oscillations are caused by interference effects which occur when the film thickness is of the same order of magnitude as the wavelength of the incoming light.
What to read after Use of the Differential Reflectometer in the Study of Thin Film Corrosion Products On Copper?
You can find similar books in the "Read Also" column, or choose other free books by Shanley, Charles William to read onlineMoreLess
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